Laser diode testing system and laser diode testing method

A laser diode testing system for testing a plurality of laser diodes, each laser diode including at least one contact, the laser diode testing system comprising:

• a first transfer device, coupled to an electromagnetic slide, the first transfer device including at least one permanent magnet, the electromagnetic slide including a plurality of magnetic field excitation units arranged in a longitudinal direction of the electromagnetic slide, the plurality of laser diodes being placed on the first transfer device;
• a first photoelectric test station, including a first photoelectric measuring device and a first probe module, wherein each of the first photoelectric measuring device and first probe module include electric circuitry;
• and
• a main controller, electrically connected to the plurality of magnetic field excitation units of the electromagnetic slide, the first photoelectric measuring device, and the first probe module,
• wherein a magnetic field is generated by at least one of the plurality of magnetic field excitation units of the electromagnetic slide under control of the main controller and interacts with a magnetic field generated by the at least one permanent magnet of the first transfer device, so that the first transfer device is driven to transfer the plurality of laser diodes to the first photoelectric test station or away from the first photoelectric test station;
• when the first transfer device is located at the first photoelectric test station, the first probe module is controlled by the main controller and brought into electrical contact with the at least one contact of each laser diode in sequence, and the first photoelectric measuring device is controlled by the main controller and sequentially measures at least one of an electrical characteristic and an optical characteristic of each laser diode electrically contacted by the first probe module.