Accessibility measurement system

A computing device comprising:

• a memory that stores instructions;
• and
• one or more processors configured by the instructions to perform operations comprising:
• analyzing at least one sensor of the computing device to determine that the computing device is in a substantially flat position on a first surface;
• activating a camera of the computing device, the camera comprising a depth sensor;
• detecting a second surface in a camera view of the camera;
• analyzing pixel measurements from the depth sensor in a predefined area of the detected second surface to determine a minimum measurement of all of the pixel measurements in the predefined area of the detected surface;
• causing display of the minimum measurement from the first surface to the second surface overlaid on an image of the first and second surface in the camera view on a user interface of the computing device;
• and
• capturing an image of the display of the minimum measurement from the first surface to the second surface overlaid on the image of the first and second surface.

A nontransitory computer-readable medium comprising instructions stored thereon that are executable by at least one processor to cause a computing device to perform operations comprising:

• analyzing at least one sensor of the computing device to determine that the computing device is in a substantially flat position on the first surface;
• activating a camera of the computing device, the camera comprising a depth sensor;
• detecting a second surface in a camera view of the camera;
• analyzing pixel measurements from the depth sensor in a predefined area of the detected second surface to determine a minimum measurement of all of the pixel measurements in the predefined area of the detected surface;
• causing display of the minimum measurement from the first surface to the second surface overlaid on an image of the first and second surface in the camera view on a user interface of the computing device;
• and
• capturing an image of the display of the minimum measurement from the first surface to the second surface overlaid on the image of the first and second surface.