Semiconductor device and fabrication method for semiconductor device
AssigneeFuji Electric Co., Ltd.
InventorsMotoyoshi Kubouchi, Kosuke Yoshida, Soichi Yoshida, Koh Yoshikawa, Nao Suganuma
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AssigneeFuji Electric Co., Ltd.
InventorsMotoyoshi Kubouchi, Kosuke Yoshida, Soichi Yoshida, Koh Yoshikawa, Nao Suganuma
Estimating the term…
A semiconductor device includes trench portions arrayed in a first direction on an upper surface side of a semiconductor substrate, a first conductivity type lower surface region provided in a part of a lower surface of the semiconductor substrate, a second conductivity type base region provided on the upper surface side, a first conductivity type first region disposed between the base region and the lower surface region, a first conductivity type upper surface region provided on an upper surface of the semiconductor substrate, and a second conductivity type bottom region disposed continuously in the first direction to be in contact with bottom portions of the trench portions. In a cross section along the first direction and perpendicular to the upper and lower surfaces and passing through the lower surface region, one end portion of the bottom region in the first direction locates directly above the lower surface region.
A semiconductor device comprising:
Dependencies are inferred from the claim text.