Circuit for reading out data, method for reading out data and memory

A method for reading out data, applicable for a data readout circuit, comprising:

• reading out data in a memory subcircuit to a global data line based on a column selection signal;
• providing an initial grab signal;
• generating a sub-grab signal for each of the storage areas based on an initial grab signal and a data transmission delay time of each of the storage areas to cause that a time interval between a time when the read-write control circuit receives data transmitted from a global data line by each of the storage areas and a time when the read-write control circuit receives the sub-grab signal corresponding to the storage area satisfies a preset range,
• wherein the data transmission delay time of the storage area close to a column decoding circuit is less than the data transmission delay time of the storage area far from the column decoding circuit,
• generating a grab enable signal based on all sub-grab signals;
• and
• reading out data of the global data line to a data bus based on the grab enable signal.

A memory, comprising:

• a read-write control circuit, a column decoding circuit and a plurality of storage areas;
• wherein each of the storage areas is connected to a global data line, and reads out data stored in a memory subcircuit to the global data line based on a column selection signal through the column decoding circuit;
• and
• data on the global data line is read out by using a circuit for reading out data comprising:
• a delay generation circuit, configured to generate a sub-grab signal for each of the storage areas based on an initial grab signal and the data transmission delay time of each of the storage areas, and generate a grab enable signal based on all sub-grab signals,
• wherein the data transmission delay time of the storage area close to a column decoding circuit is less than the data transmission delay time of the storage area far from the column decoding circuit,
• a time interval between a time when the read-write control circuit receives data transmitted from a global data line by each of the storage areas and a time when the read-write control circuit receives the sub-grab signal corresponding to the storage area satisfies a preset range;
• the read-write control circuit is configured to read out data of the global data line to a data bus based on the grab enable signal;
• and
• the global data line is configured to read out data of the storage areas through the column decoding circuits based on a column selection signal.