Test control device, test system, and control method for device testing with predictable and reduced test times

A test system, comprising:

• a test prediction model generation device;
• and
• a test control device, wherein
• the test prediction model generation device uses log data obtained by executing a test on a device under test to generate a test prediction model for predicting a controlled variable value from the device under test executing processing based on a command associated with a manipulated variable,
• the test control device includes:
• a test manipulated variable generation device configured to predict a value for a controlled variable for a device under test based on the test prediction model to generate a first manipulated variable that is based on a difference between a target value and a first controlled variable value from the device under test, and
• a test processing device configured to acquire a second controlled variable value from the device under test based on the generated first manipulated variable;
• and
• the test manipulated variable generation device is further configured to:
• notify the device under test of an end of a test if the second controlled variable value is equal to or greater than the target value, and
• use the test prediction model to generate a second manipulated variable based on a difference between the target value and the second controlled variable value if the second controlled variable value is less than the target value.

A control method, comprising:

• using a test prediction model that predicts a controlled variable value from a device under test that is executing processing based on a command associated with a manipulated variable including one or more individual variables to generate a first manipulated variable based on a difference between a target value and a first controlled variable value;
• acquiring a second controlled variable value from the device under test, wherein the device under test is executing processing based on the command associated with the first manipulated variable;
• notifying the device under test of end of a test when the second controlled variable value is equal to or greater than the target value;
• and
• using the test prediction model to generate a second manipulated variable based on a difference between the target value and the second controlled variable value when the second controlled variable is less than the target value.