Two-dimensional diffraction grating
AssigneeASML Netherlands B.V.
InventorsPieter Cristiaan De Groot, Johannes Jacobus Matheus Baselmans, Derick Yun Chek Chong, Yassin Chowdhury
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AssigneeASML Netherlands B.V.
InventorsPieter Cristiaan De Groot, Johannes Jacobus Matheus Baselmans, Derick Yun Chek Chong, Yassin Chowdhury
Estimating the term…
A two-dimensional diffraction grating for a phase-stepping measurement system for determining an aberration map for a projection system comprises a substrate provided with a square array of through-apertures, wherein the diffraction grating is self-supporting. It will be appreciated that for a substrate provided with a square array of through-apertures to be self-supporting at least some substrate material is provided between each through-aperture and the adjacent through apertures. A method of designing a two-dimensional diffraction grating for a phase-stepping measurement system for determining an aberration map for a projection system comprises: selecting a general geometry for the two-dimensional diffraction grating, the general geometry having at least one parameter; and selecting values for the least one parameter that result in a grating efficiency map for the two-dimensional diffraction grating so as to control the contributions to a first harmonic of a phase stepping signal.
A two-dimensional diffraction grating for a phase-stepping measurement system for determining an aberration map for a projection system, the diffraction grating comprising:
A method of manufacturing a two-dimensional diffraction grating for a phase-stepping measurement system for determining an aberration map for a projection system, the method comprising:
A two-dimensional diffraction grating, comprising:
Dependencies are inferred from the claim text.