Microscopy system, method and computer program for aligning a specimen carrier

A method for aligning a sample carrier of a microscope, comprising:

• capturing an overview image in which the sample carrier or a sample carrier environment is at least partially visible;
• entering the overview image or an image calculated therewith into a machine learning model, wherein the machine learning model is trained using training data to calculate a centring movement for an input image;
• calculating a centring movement with the machine learning model from the input overview image or image calculated therefrom;
• performing a sample stage adjustment based on the centring movement;
• capturing a centred overview image after the sample stage adjustment has been performed.

A computer program for aligning a sample carrier of a microscope, the computer program comprising commands stored on a non-transitory computer-readable medium, which when executed by a computer, cause the computer to perform the following acts:

• receiving an overview image in which the sample carrier or a sample carrier environment is at least partially visible;
• assessing the overview image with a machine learning model, which performs an object localization in the overview image with respect to at least one predefined object;
• and
• determining a centring movement based on the object localization, wherein the centring movement indicates a sample stage movement for moving the sample carrier towards an image centre of the overview image.