Differential measurement probe

A differential measurement probe comprising:

• a first support plate;
• a second support plate arranged in parallel to the first support plate;
• a first printed circuit probe tip that comprises a first contact section for contacting a device under test;
• and
• a second printed circuit probe tip that comprises a second contact section for contacting a device under test;
• wherein the first printed circuit probe tip and the second printed circuit probe tip are arranged between the first support plate and the second support plate and are mechanically supported by the first support plate and the second support plate,
• wherein the first printed circuit probe tip, and the second printed circuit probe tip each comprise a multi-layer printed circuit board with a planar inner conductor layer and a planar outer conductor layer on one side of the inner conductor layer, and another planar outer conductor layer on the other side of the inner conductor layer.

A differential measurement probe comprising:

• a first support plate;
• a second support plate arranged in parallel to the first support plate;
• a first printed circuit probe tip that comprises a first contact section for contacting a device under test;
• and
• a second printed circuit probe tip that comprises a second contact section for contacting a device under test;
• wherein the first printed circuit probe tip and the second printed circuit probe tip are arranged between the first support plate and the second support plate and are mechanically supported by the first support plate and the second support plate,
• wherein the edges of the first printed circuit probe tip and the second printed circuit probe tip are covered with a conductive material to electrically couple the two conductive shielding layers on the upside and the downside of the first printed circuit probe tip or the second printed circuit probe tip, respectively.