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US 12,007,411 B2Granted
Test socket having an automated lid
AssigneeTeradyne, Inc.
InventorsJohn P. Toscano, Christopher Bruno, David Graziose
Life of this patent
Estimating the term…
Abstract
An example test socket for a test system includes a receptacle to make electrical and mechanical connections to a device under test (DUT) and a lid to cover the DUT in the receptacle. The lid is controllable to open automatically to enable receipt of the DUT in the receptacle and, following receipt of the DUT, to close automatically to cover the DUT in the receptacle. Closing the lid applies force to the DUT to complete the electrical and mechanical connections between the test socket and the DUT.
Claims26
A test socket for a test system, the test socket comprising:
- a receptacle to make electrical and mechanical connections to a device under test (DUT);
- a lid to cover the DUT in the receptacle, the lid being controllable to open automatically to enable receipt of the DUT in the receptacle and, following receipt of the DUT, to close automatically to cover the DUT in the receptacle, where closing the lid applies force to the DUT to complete the electrical and mechanical connections between the test socket and the DUT;
- an actuator to control opening and closing of the lid, the actuator being configured to move the lid perpendicularly to the receptacle and to pivot the lid relative to the receptacle;
- and
- a gear connected to the actuator, the gear being usable to move the lid perpendicularly to the receptacle.
2 more elements
A test socket for a test system, the test socket comprising:
- a receptacle to make electrical and mechanical connections to a device under test (DUT);
- a lid to cover the DUT in the receptacle, the lid being controllable to open automatically to enable receipt of the DUT in the receptacle and, following receipt of the DUT, to close automatically to cover the DUT in the receptacle, where closing the lid applies force to the DUT to complete the electrical and mechanical connections between the test socket and the DUT;
- an actuator to control opening and closing of the lid, the actuator being configured to move the lid perpendicularly to the receptacle and to pivot the lid relative to the receptacle;
- and
- wherein the actuator comprises a helical worm drive screw that causes motion of the lid and that is configured to provide a clamping force to the DUT to complete the electrical and mechanical connections between the test socket and the DUT.
2 more elements
A test socket for a test system, the test socket comprising:
- a receptacle to make electrical and mechanical connections to a device under test (DUT);
- a lid to cover the DUT in the receptacle, the lid being controllable to open automatically to enable receipt of the DUT in the receptacle and, following receipt of the DUT, to close automatically to cover the DUT in the receptacle, where closing the lid applies force to the DUT to complete the electrical and mechanical connections between the test socket and the DUT;
- an actuator to control opening and closing of the lid, the actuator being configured to move the lid perpendicularly to the receptacle and to pivot the lid relative to the receptacle;
- and
- a plate having a track having a first branch that extends perpendicularly to the receptacle and a second branch that extends obliquely relative to the receptacle.
2 more elements
A test socket for a test system, the test socket comprising:
- a receptacle to make electrical and mechanical connections to a device under test (DUT);
- a lid to cover the DUT in the receptacle, the lid being controllable to open automatically to enable receipt of the DUT in the receptacle and, following receipt of the DUT, to close automatically to cover the DUT in the receptacle, where closing the lid applies force to the DUT to complete the electrical and mechanical connections between the test socket and the DUT;
- and
- a thermal control system to control a temperature of the DUT in the test socket separately from control over temperatures of other DUTs in other test sockets, the thermal control system comprising a thermoelectric cooler (TEC) and a structure connected to the lid that is thermally conductive, the TEC being in thermal communication with the DUT to control the temperature of the DUT by transferring heat between the DUT and the structure.
1 more element
A test socket for a test system, the test socket comprising:
- a receptacle to make electrical and mechanical connections to a device under test (DUT);
- a lid to cover the DUT in the receptacle, the lid being controllable to open automatically to enable receipt of the DUT in the receptacle and, following receipt of the DUT, to close automatically to cover the DUT in the receptacle, where closing the lid applies force to the DUT to complete the electrical and mechanical connections between the test socket and the DUT;
- a first plate on a first side of the lid, the first plate comprising first tracks;
- a second plate on a second side of the lid, the second plate comprising second tracks;
- first rollers on the first side of the lid;
- and
- second rollers on the second side of the lid;
- wherein, during opening and closing of the lid, the first rollers move along the first tracks and the second rollers move along the second tracks.
5 more elements
A test socket for a test system, the test socket comprising:
- a receptacle to make electrical and mechanical connections to a device under test (DUT);
- a lid to cover the DUT in the receptacle, the lid being controllable to open automatically to enable receipt of the DUT in the receptacle and, following receipt of the DUT, to close automatically to cover the DUT in the receptacle, where closing the lid applies force to the DUT to complete the electrical and mechanical connections between the test socket and the DUT;
- a first set of plates on a first side of the lid, the first set of plates comprising first tracks;
- a second set of plates on a second side of the lid, the second set of plates comprising second tracks;
- first rollers on the first side of the lid;
- and
- second rollers on the second side of the lid;
- wherein, during opening and closing of the lid, the first rollers move along the first tracks and the second rollers move along the second tracks.
5 more elements
A test system comprising:
- a test socket comprising:
- a receptacle to make electrical and mechanical connections to a device under test (DUT);
- and
- a lid to cover the DUT in the receptacle, the lid being controllable to open automatically to enable receipt of the DUT in the receptacle and, following receipt of the DUT, to close automatically to cover the DUT in the receptacle, where closing the lid applies force to the DUT to complete the electrical and mechanical connections between the test socket and the DUT;
- a pick-and-place robot to move the DUT relative to the test socket;
- and
- one or more processing devices to coordinate operation of the pick-and-place robot and to control opening and closing the lid so that the lid is pivoted when the pick-and-place robot reaches the test socket.
4 more elements
A test system comprising:
- packs comprising:
- test sockets for testing devices under test (DUTs);
- and
- at least some test electronics for performing tests on the DUTs in the test sockets, where different packs are configured to have different configurations, the different configurations comprising at least different numbers of test sockets arranged at different pitches;
- wherein a test socket among the test sockets comprises:
- a receptacle to make electrical and mechanical connections a DUT;
- and
- a lid to cover the DUT in the receptacle, the lid being controllable to open automatically to enable receipt of the DUT in the receptacle and, following receipt of the DUT, to close automatically to cover the DUT in the receptacle, where closing the lid applies force to the DUT to make the electrical and mechanical connections between the test socket and the DUT.
5 more elements
Dependencies are inferred from the claim text.