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US 12,007,407 B2Granted
Sensor module and measurement system
AssigneeSeiko Epson Corporation
InventorFumikazu Otani
Life of this patent
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Abstract
A sensor module includes: an inertial sensor; and a processing circuit processing an output signal from the inertial sensor. The processing circuit varies processing of the output signal according to a sampling period for acquiring the output signal. The processing circuit may change the sampling period for acquiring the output signal according to a content of processing of the output signal.
Claims5
A sensor module comprising:
- a plurality of inertial sensors;
- and
- a processing circuit selecting one of a plurality of signal processing modes as a selected signal processing mode, and processing output signals from the plurality of inertial sensors according to the selected signal processing mode,
- the processing circuit selecting the one of the plurality of signal processing modes as the selected signal processing mode based on a length of a sampling period for acquiring the output signals, wherein
- the plurality of signal processing modes includes a signal processing mode having an angular velocity mode in which data from an angular velocity sensor device, as an inertial sensor of the plurality of inertial sensors, is processed, and an acceleration mode in which data from an acceleration sensor device, as an inertial sensor of the plurality of inertial sensors, is processed, and, in said signal processing mode, the processing circuit selects either of the angular velocity mode or the acceleration mode such that one of the data associated with the angular velocity mode and the acceleration mode is omitted from processing.
2 more elements
Dependencies are inferred from the claim text.