Apparatus and method for x-ray fluorescence analysis

An X-ray fluorescence analysis apparatus for analysing a sample, the X-ray fluorescence analysis apparatus comprising:

• a measurement chamber for holding the sample in an air atmosphere;
• an X-ray source arranged to irradiate the sample with a primary X-ray beam, the X-ray source comprising an anode comprising material having an atomic number that is less than 25;
• an X-ray filter arranged between the X-ray source and the sample, wherein the X-ray filter is configured to transmit the primary X-ray beam and to attenuate at least some X-rays having energies between 2 keV and 3 keV, wherein the X-ray filter has an attenuation of greater than 95% at an X-ray energy of greater than 2 keV and less than 3 keV, or wherein the filter has an attenuation of greater than 95% at an energy range of between 2.0 keV and 2.9 keV;
• an X-ray detector arranged to detect X-rays emitted by the sample, wherein the X-ray detector is configured to determine a measured X-ray intensity and a measured X-ray energy;
• a sensor arrangement configured to measure air pressure and air temperature;
• and
• a processor configured to:
• receive the measured X-ray intensity;
• receive an air pressure measurement and an air temperature measurement from the sensor arrangement;
• and
• carry out a compensation calculation for adjusting the measured X-ray intensity using the air pressure measurement and the air temperature measurement.