X-ray beam shaping apparatus and method
AssigneeMalvern Panalytical Limited
InventorsMilen Gateshki, Alexander Kharchenko, Detlef Beckers, Nicholas Norberg
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Abstract
A beam shaping apparatus (10) for use in an X-ray analysis device (40). The beam shaping apparatus processes an input beam (32) from an X-ray beam source (20), and generates an output beam (34) with an output beam shape for irradiating a sample (112) held by a sample holder (22) of the X-ray analysis device. Movement of the output beam shape is controlled in dependence upon a varying tilt angle (χ) of the sample (112), this defined by a tilt position of the sample holder (22).
Claims13
A beam shaping apparatus (10) for use in an X-ray analysis device (40), wherein the X-ray analysis device comprises a sample holder (22), for holding a sample (112) at a variable tilt angle (χ) about a tilt axis (24),
- the beam shaping apparatus (10) comprising:
- a beam shaping element (28) adapted to receive an input beam (32) from an X-ray source (20), and generate an output beam (34) having an output beam shape, and
- a controller (36) operatively coupleable in use with the X-ray analysis device (40),
- the controller (36) adapted to control movement of the output beam shape dependent upon the variable tilt angle (χ) of the sample (112),
- wherein the output beam shape is an elongate shape, the elongate shape having a length and a width, wherein the length is longer than the width, and the output beam shape defining a longitudinal axis (50) extending along the length and a transverse axis extending along the width, and
- wherein the movement includes rotation, and wherein the controller (36) is configured to control rotation of the output beam shape so as to maintain the longitudinal axis (50) substantially parallel with a plane defined by a surface of a sample (112) held in use by the sample holder (22).
An X-ray analysis device (40) comprising:
- a sample holder (22), for holding a sample (112) at variable tilt angle (χ) about a tilt axis (24);
- an X-ray source (20);
- a beam shaping element (28) adapted to receive an input beam (32) from the X-ray source (20), and generate an output beam (34) having an output beam shape, the sample holder (22) being arranged to receive the output beam, and
- a controller (36) operatively coupled with the X-ray analysis device (40), and adapted to control movement of the output beam shape dependent upon the variable tilt angle (χ),
- wherein the output beam shape is an elongate shape, the elongate shape having a length and a width, wherein the length is longer than the width, and the output beam shape defining a longitudinal axis (50) extending along the length and a transverse axis extending along the width, and
- wherein the movement includes rotation, and wherein the controller (36) is configured to control rotation of the output beam shape so as to maintain the longitudinal axis (50) substantially parallel with a plane defined by a surface of a sample (112) held in use by the sample holder (22).
A method of controlling a beam shaping apparatus (10), the apparatus for use in an X-ray analysis device (40),
- wherein the X-ray analysis device comprises a sample holder (22), for holding a sample (112) at a variable tilt angle (χ) about a tilt axis (24), and
- wherein the beam shaping apparatus comprises a beam shaping element (28) adapted to receive an input beam (32) from an X-ray source (20), and generate an output beam (34) having an output beam shape, and
- the method comprising:
- obtaining from the X-ray analysis device (40) a signal indicative of the tilt angle (χ) of the sample (112) about the tilt axis (24), and
- controlling movement of the output beam shape dependent upon the variable tilt angle (χ), based on the obtained signal,
- wherein the output beam shape is an elongate shape, the elongate shape having a length and a width, wherein the length is longer than the width, and the output beam shape defining a longitudinal axis (50) extending along the length and a transverse axis extending along the width, and
- wherein the movement includes rotation, and wherein the controller (36) is configured to control rotation of the output beam shape so as to maintain the longitudinal axis (50) substantially parallel with a plane defined by a surface of a sample (112) held in use by the sample holder (22).
Dependencies are inferred from the claim text.