US 12,007,226 B2 · Measurement of thickness of scale or corrosion

Abstract

A method for measuring a thickness of a deposit layer on a metal or alloy substrate using an X-ray fluorescence (XRF) spectrometer, where the deposit layer includes scale deposits or corrosion products. As part of the method, an elemental composition of the deposit layer or the metal or alloy substrate is measured using the XRF spectrometer. The thickness of the deposit layer is obtained from the elemental composition using a calibration relationship between deposit layer thicknesses and corresponding elemental compositions of the deposit layer or the metal/alloy substrate. The method can be applied to determine the rate of deposit layer formation and evaluate the effectiveness of a treatment.

Claims20

Dependent claims

A method for measuring a thickness of a deposit layer on a metal or alloy substrate using an X-ray fluorescence (XRF) spectrometer, wherein the deposit layer includes scale deposits, corrosion products, or both, the method comprising:

measuring an elemental composition of at least one of the deposit layer, the metal substrate, or the alloy substrate using the XRF spectrometer;
and
obtaining the thickness of the deposit layer from the elemental composition using a calibration relationship between deposit layer thicknesses and corresponding elemental compositions of the at least one of the deposit layer, the metal substrate, or the alloy substrate, wherein the calibration relationship is a relationship between deposit layer thicknesses measured by scanning electron microscopy (SEM) and corresponding elemental compositions of the at least one of the deposit layer, the metal substrate, or the alloy substrate measured by the XRF spectrometer.

A method for measuring a rate of deposit layer formation on a metal or alloy substrate using an X-ray fluorescence (XRF) spectrometer, wherein the deposit layer includes scale deposits or corrosion products, the method comprising:

obtaining a first elemental composition of the deposit layer or the metal or alloy substrate;
exposing the metal or alloy substrate to a scaling or corrosive environment for a first period;
measuring a second elemental composition of the deposit layer or metal or alloy substrate using the XRF spectrometer after the first period;
obtaining a first change in elemental composition by calculating a difference between the first and second elemental composition of the deposit layer or the metal or alloy substrate;
and
determining a first rate of deposit layer formation on the metal or alloy substrate during the first period using a calibration relationship between rates of deposit layer formation and corresponding changes in elemental composition.

3 more elements

Dependencies are inferred from the claim text.

Measurement of thickness of scale or corrosion

Life of this patent

Measurement of thickness of scale or corrosion

Life of this patent

Abstract

Claims20