Adjustment method and device for chip output characteristics

An adjustment device for chip output characteristics, comprising:

• a detector, which is configured to detect the state of each of a plurality of E-fuses in a chip to be tested;
• and
• a processor configured to
• determine a target adjustment solution corresponding to the chip among a plurality of adjustment solutions according to the output performance of the chip to be tested if detecting that no E-fuse is blown;
• perform blowing treatment on one of the plurality of E-fuses in the chip to be tested according to the target adjustment solution, so as to adjust the output characteristics of the chip to be tested;
• and
• recover the output characteristics of the chip to be tested to the initial output characteristics before the blowing treatment.

An adjustment method for chip output characteristics, comprising:

• detecting a state of each of a plurality of Electrically Programmable Fuses (E-fuses) in a chip to be tested;
• determining a target adjustment solution corresponding to the chip among a plurality of adjustment solutions according to an output performance of the chip to be tested when detecting that no E-fuse is blown;
• and
• performing blowing treatment on one of the plurality of E-fuses in the chip to be tested according to the target adjustment solution, so as to adjust an output characteristics of the chip to be tested;
• wherein the output performance is two groups of data description output by a clock signal, and said determining the target adjustment solution corresponding to the chip in the plurality of adjustment solutions according to the output performance of the chip to be tested comprises:
• respectively calculating absolute differences of the two groups of data of the chip to be tested by adopting the plurality of adjustment solutions;
• and
• determining the target adjustment solution corresponding to the chip to be tested in the plurality of adjustment solutions according to the plurality of absolute differences.