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US 12,002,516 B2Granted
Memory block characteristic determination
AssigneeMicron Technology, Inc.
InventorsZhongyuan Lu, Niccolo' Righetti
Life of this patent
Estimating the term…
Abstract
Bake temperatures for memory blocks can be determined as part of an operation to allocate memory blocks for us by a memory device. If a temperature of a particular memory block among the plurality of memory blocks meets or exceeds a threshold operational temperature corresponding to a memory device containing the plurality of memory blocks, the particular memory block can be allocated for receipt and/or storage of data.
Claims24
A method, comprising:
- determining, for a plurality of memory blocks, respective temperatures corresponding to each of the memory blocks;
- determining whether a temperature of a first memory block among the plurality of memory blocks meets or exceeds a first threshold operational temperature corresponding to a memory device containing the plurality of memory blocks;
- writing information to a particular memory block based on the determination that the temperature of the first memory block meets or exceeds the first threshold operational temperature of the memory device;
- and
- updating the first threshold operational temperature of the memory device to a second threshold operational temperature that is less than the first threshold operational temperature of the memory device based on determining that none of the memory blocks among the plurality of memory blocks meets or exceeds the first threshold operational temperature corresponding to the memory device.
2 more elements
An apparatus, comprising:
- a memory device comprising a plurality of memory blocks;
- and
- a controller coupled to the memory device, wherein the controller is configured to:
- determine respective temperatures for empty memory blocks among the plurality of memory blocks;
- generate a list comprising address locations corresponding to each of the empty memory blocks, wherein the list is organized according to the determined respective temperatures of the empty memory blocks among the plurality of memory blocks;
- determine whether a temperature of a particular empty memory block among the plurality of empty memory blocks in the list meets or exceeds a first threshold operational temperature corresponding to the memory device;
- control writing of information to an address location corresponding to the particular empty memory block based, at least in part, on the determination that the temperature of the particular empty memory block meets or exceeds the first threshold operational temperature of the memory device;
- and
- update the first threshold operational temperature of the memory device to a second threshold operational temperature that is less than the first threshold operational temperature of the memory device based on determining that none of the empty memory blocks among the plurality of empty memory blocks in the list meets or exceeds the first threshold operational temperature corresponding to the memory device.
6 more elements
An apparatus, comprising:
- a memory device comprising a plurality of memory blocks;
- and
- a processing device coupled to the memory device, wherein the processing device is configured to:
- determine that the memory device has reached or exceeded an operational temperature threshold;
- generate a list of memory blocks among the plurality of memory blocks;
- sort the list of memory blocks such that the memory blocks associated with the list are ranked based on a determined temperature of each memory block among the plurality of memory blocks, or a determined amount of time that each memory block among the plurality of memory blocks in the list has experienced the determined temperature, or both;
- determine whether a temperature of an empty memory block among the plurality of memory blocks in the ranked list meets or exceeds a first threshold operational temperature corresponding to the memory device or whether the determined amount of time that the empty memory block among the plurality of memory blocks in the ranked list has experienced the determined temperature meets or exceeds a threshold amount of time corresponding to the determined temperature, or both;
- control writing of information to the empty memory block based on:
- a determination that the temperature of the empty memory block in the ranked list meets or exceeds the first threshold operational temperature of the memory device, or
- a determination that the amount of time that the empty memory block in the ranked list has experienced the determined temperature meets or exceeds the threshold amount of time corresponding to the determined temperature, or both;
- and
- update the first threshold operational temperature of the memory device to a second threshold operational temperature that is less than the first threshold operational temperature of the memory device based on:
- a determination that none of the empty memory blocks among the plurality of memory blocks in the ranked list meets or exceeds the first threshold operational temperature corresponding to the memory device, or
- a determination that none of the empty memory blocks among the plurality of memory blocks in the ranked list has experienced the determined temperature meets or exceeds the threshold amount of time corresponding to the determined temperature.
11 more elements
A method, comprising:
- determining, for a plurality of memory blocks, respective temperatures corresponding to each of the memory blocks;
- determining whether a temperature of a first memory block among the plurality of memory blocks meets or exceeds a first threshold operational temperature corresponding to a memory device containing the plurality of memory blocks;
- determining that none of the memory blocks among the plurality of memory blocks meets or exceeds the first threshold operational temperature corresponding to the memory device;
- updating the first threshold operational temperature of the memory device to a second threshold operational temperature that is less than the first threshold operational temperature of the memory device;
- determining whether a temperature of a memory block among the plurality of memory blocks meets or exceeds the second threshold operational temperature corresponding to the memory device;
- and
- writing information to the memory block that meets or exceeds the second threshold operational temperature of the memory device.
4 more elements
A method, comprising:
- determining, for a plurality of memory blocks, respective temperatures corresponding to each of the memory blocks;
- determining a temperature of a first memory block among the plurality of memory blocks meets or exceeds a first threshold operational temperature corresponding to a memory device containing the plurality of memory blocks;
- determining that the temperature of the first memory block is the same as a temperature of a second memory block;
- determining a time period that the first memory block and the second memory block have experienced their respective temperatures;
- and
- writing information to the first memory block or the second memory block that has experienced their respective temperature for a greater time period.
3 more elements
An apparatus, comprising:
- a memory device comprising a plurality of memory blocks;
- and
- a controller coupled to the memory device, wherein the controller is configured to:
- determine respective temperatures for empty memory blocks among the plurality of memory blocks;
- generate a list comprising address locations corresponding to each of the empty memory blocks, wherein the list is organized according to the determined respective temperatures of the empty memory blocks among the plurality of memory blocks;
- determine whether a temperature of a particular empty memory block among the plurality of empty memory blocks in the list meets or exceeds a first threshold operational temperature corresponding to the memory device;
- determine that none of the empty memory blocks among the plurality of empty memory blocks in the list meets or exceeds the first threshold operational temperature corresponding to the memory device;
- update the first threshold operational temperature of the memory device to a second threshold operational temperature that is less than the first threshold operational temperature of the memory device;
- determine whether a temperature of an empty memory block among the plurality of empty memory blocks in the list meets or exceeds the second threshold operational temperature corresponding to the memory device;
- and
- control writing of information to the empty memory block in the list based, at least in part, on the determination that the temperature of the empty memory block meets or exceeds the second threshold operational temperature of the memory device.
8 more elements
An apparatus, comprising:
- a memory device comprising a plurality of memory blocks;
- and
- a controller coupled to the memory device, wherein the controller is configured to:
- determine respective temperatures for empty memory blocks among the plurality of memory blocks;
- determine respective time periods that the empty memory blocks among the plurality of memory blocks have been exposed to the temperature;
- generate a list comprising address locations corresponding to each of the empty memory blocks among the plurality of memory blocks, wherein the list is organized according to the determined respective temperatures of the empty memory blocks and the determined respective time periods that the empty memory blocks have been exposed to the temperature;
- determine whether a temperature of a particular empty memory block among the plurality of empty memory blocks in the list meets or exceeds a first threshold operational temperature corresponding to the memory device;
- determine whether a time period that the particular empty memory block among the plurality of memory blocks in the list meets or exceeds a threshold time period associated with exposure to the temperature among the plurality of empty memory blocks in the list;
- and
- control writing of information to an address location corresponding to the particular empty memory block based, at least in part, on the determination that the temperature of the particular empty memory block meets or exceeds the first threshold operational temperature of the memory device and the time period that the particular empty memory block meets or exceeds the threshold time period.
7 more elements
An apparatus, comprising:
- a memory device comprising a plurality of memory blocks;
- and
- a controller coupled to the memory device, wherein the controller is configured to:
- determine respective temperatures for empty memory blocks among the plurality of memory blocks by:
- activating one or more word lines coupled to the empty memory blocks among the plurality of memory blocks;
- and
- determining activity associated with the empty memory blocks among the plurality of memory blocks based on activation of the one or more word lines coupled to the empty memory blocks;
- generate a list comprising address locations corresponding to each of the empty memory blocks, wherein the list is organized according to the determined respective temperatures of the empty memory blocks among the plurality of memory blocks;
- determine whether a temperature of a particular empty memory block among the plurality of empty memory blocks in the list meets or exceeds a first threshold operational temperature corresponding to the memory device;
- and
- control writing of information to an address location corresponding to the particular empty memory block based, at least in part, on the determination that the temperature of the particular empty memory block meets or exceeds the first threshold operational temperature of the memory device.
8 more elements
An apparatus, comprising:
- a memory device comprising a plurality of memory blocks;
- and
- a processing device coupled to the memory device, wherein the processing device is configured to:
- determine that the memory device has reached or exceeded an operational temperature threshold;
- generate a list of memory blocks among the plurality of memory blocks;
- sort the list of memory blocks such that the memory blocks associated with the list are ranked based on a determined temperature of each memory block among the plurality of memory blocks, or a determined amount of time that each memory block among the plurality of memory blocks in the list has experienced the determined temperature, or both;
- determine whether a temperature of an empty memory block among the plurality of memory blocks in the ranked list meets or exceeds a first threshold operational temperature corresponding to the memory device or whether the determined amount of time that the empty memory block among the plurality of memory blocks in the ranked list has experienced the determined temperature meets or exceeds a threshold amount of time corresponding to the determined temperature, or both;
- determine that none of the empty memory blocks among the plurality of memory blocks in the ranked list meets or exceeds the first threshold operational temperature corresponding to the memory device, or
- determine that none of the empty memory blocks among the plurality of memory blocks in the ranked list has experienced the determined temperature meets or exceeds the threshold amount of time corresponding to the determined temperature;
- and
- control writing of information to a random empty memory block based on the determination that none of the empty memory blocks among the plurality of memory blocks in the ranked list meets or exceeds the first threshold operational temperature corresponding to the memory device or the determination that none of the empty memory blocks among the plurality of memory blocks in the ranked list has experienced the determined temperature meets or exceeds the threshold amount of time corresponding to the determined temperature, or both.
8 more elements
An apparatus, comprising:
- a memory device comprising a plurality of memory blocks;
- and
- a processing device coupled to the memory device, wherein the processing device is configured to:
- determine that the memory device has reached or exceeded an operational temperature threshold;
- generate a list of memory blocks among the plurality of memory blocks;
- sort the list of memory blocks such that the memory blocks associated with the list are ranked based on a determined temperature of each memory block among the plurality of memory blocks, or a determined amount of time that each memory block among the plurality of memory blocks in the list has experienced the determined temperature, or both;
- determine whether a temperature of an empty memory block among the plurality of memory blocks in the ranked list meets or exceeds a first threshold operational temperature corresponding to the memory device or whether the determined amount of time that the empty memory block among the plurality of memory blocks in the ranked list has experienced the determined temperature meets or exceeds a threshold amount of time corresponding to the determined temperature, or both;
- control writing of information to the empty memory block based on:
- a determination that the temperature of the empty memory block in the ranked list meets or exceeds the first threshold operational temperature of the memory device, or a determination that the amount of time that the empty memory block in the ranked list has experienced the determined temperature meets or exceeds the threshold amount of time corresponding to the determined temperature, or both;
- and
- delete a record in the ranked list corresponding to the empty memory block to which the information was written subsequent to control of writing the information to the empty memory block.
8 more elements
Dependencies are inferred from the claim text.