Crystal line growing state detection method, apparatus and device for silicon rod

A method for detecting a growth state of a crystalline line of a silicon rod, wherein the method comprises:

• in a process of constant-diameter growth of the silicon rod, acquiring a sample image of the silicon rod;
• providing a detection area in the sample image, wherein the detection area overlaps with a crystalline-line growth line of the silicon rod, and in the process of the constant-diameter growth of the silicon rod, the crystalline line of the silicon rod grows along the crystalline-line growth line;
• generating a grayscale-value curve of the detection area;
• and
• according to the grayscale-value curve, determining the growth state of the crystalline line of the silicon rod on the crystalline-line growth line,
• wherein the detection area comprises:
• a line segment perpendicular to an axial direction of the silicon rod, or a rectangular area perpendicular to an axial direction of the silicon rod, wherein a plane of the rectangular area is perpendicular to the axial direction of the silicon rod.