Measurement method and measurement system
AssigneeSeiko Epson Corporation
InventorTaisuke Yamauchi
Life of this patent
Estimating the term…
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AssigneeSeiko Epson Corporation
InventorTaisuke Yamauchi
Estimating the term…
A measurement method includes measuring a normal vector of a measured portion based on a first vector representing a direction from a measured portion to a principal point of a first lens, a second vector representing a direction from the measured portion to a principal point of a second lens, a third vector representing a direction from the measured portion to a principal point of a third lens, a first value representing luminance of the measured portion in a situation in which the first projector projects a fourth image via the first lens, a second value representing the luminance of the measured portion in a situation in which the second projector projects a fifth image via the second lens, and a third value representing the luminance of the measured portion in a situation in which the third projector projects a sixth image via the third lens.
A measurement method comprising:
A measurement system comprising:
A measurement system comprising:
Dependencies are inferred from the claim text.