Error reduction in reconstructed images in defect detection method, electronic device and storage medium

An electronic device comprising a memory and a processor, the memory stores at least one computer-readable instruction, which when executed by the processor causes the processor to:

• in response to receiving a defect detection request, acquire a product image and a plurality of positive sample images according to the defect detection request;
• encode the product image to obtain a target vector corresponding to the product image by using an encoder, encode the plurality of positive sample images to obtain a plurality of latent vectors corresponding to the plurality of positive sample images by using the encoder;
• decode the target vector to obtain a target image corresponding to the product image by using a decoder corresponding to the encoder, decode the plurality of latent vectors to obtain a plurality of reconstructed images corresponding to the plurality of positive sample images by using the decoder;
• compare the target image with the product image to obtain a target error, compare each of the plurality of reconstructed images with the corresponding positive sample image to obtain a reconstruction error;
• input the target vector into a Gaussian mixture model to obtain a test probability of the product image, input the plurality of latent vectors into the Gaussian mixture model to obtain an estimated probability of each corresponding positive sample image;
• determine a test error of the product image according to the target error and the test probability, and determine a sample error of each positive sample image according to the corresponding reconstruction error and the corresponding estimated probability;
• select an error threshold from a plurality of the sample errors and obtain a detection result of defect detection in the product image according to the test error and the error threshold.

A non-transitory storage medium having stored thereon at least one computer-readable instructions that, when the at least one computer-readable instructions are executed by a processor to implement a defect detection method, which comprises:

• in response to receiving a defect detection request, acquiring a product image and a plurality of positive sample images according to the defect detection request;
• encoding the product image to obtain a target vector corresponding to the product image by using an encoder, encoding the plurality of positive sample images to obtain a plurality of latent vectors corresponding to the plurality of positive sample images by using the encoder;
• decoding the target vector to obtain a target image corresponding to the product image by using a decoder corresponding to the encoder, decoding the plurality of latent vectors to obtain a plurality of reconstructed images corresponding to the plurality of positive sample images by using the decoder;
• comparing the target image with the product image to obtain a target error, comparing each of the plurality of reconstructed images with the corresponding positive sample image to obtain a reconstruction error;
• inputting the target vector into a Gaussian mixture model to obtain a test probability of the product image, inputting the plurality of latent vectors into the Gaussian mixture model to obtain an estimated probability of each corresponding positive sample image;
• determining a test error of the product image according to the target error and the test probability, and determining a sample error of each positive sample image according to the corresponding reconstruction error and the corresponding estimated probability;
• selecting an error threshold from a plurality of the sample errors and obtaining a detection result of defect detection in the product image according to the test error and the error threshold.