Utilizing last successful read voltage level in memory access operations
AssigneeMicron Technology, Inc.
InventorKyungjin Kim
Life of this patent
Estimating the term…
Loading patent…
AssigneeMicron Technology, Inc.
InventorKyungjin Kim
Estimating the term…
An example method of performing read operation with respect to a memory device comprises: receiving a request to perform a read operation with respect to a memory page of a memory device; identifying a block family associated with a block comprising the memory page; determining a block family-based read voltage level associated with the block family; performing, using the block family-based read voltage level, a read operation with respect to the memory page; determining, by performing an error correction operation with respect to the memory page, a new read voltage level associated with the block family; and associating, by a last successful read voltage level memory data structure, the new read voltage level as a last the successful read voltage level with the block family.
A method, comprising:
A system comprising:
A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
Dependencies are inferred from the claim text.