Test data generation apparatus, test data generation method and program

A test data generation device comprising a storage device and a processor configured to execute a method comprising:

• storing, in the storage device, a tacit knowledge test data dictionary including, in a tacit knowledge category, a generation process and test data information;
• and
• generating, for the tacit knowledge category for a target input field representing an input field for a test data generation target, by referring to the tacit knowledge test data dictionary, test data satisfying an input value constraint of the target input field based on a regular expression.

A computer-implemented method for generating test data, comprising:

• storing a tacit knowledge test data dictionary including, in a tacit knowledge category, a generation process, test data information, and an input value constraint of an input field to be used as a generation condition;
• and
• generating, for the tacit knowledge category for a target input field representing an input field for a test data generation target, by referring to the tacit knowledge test data dictionary, test data for the target input field when an input value constraint of the target input field in a test target application matches with an input value constraint of a generation condition associated with the tacit knowledge category, except when the input value constraint of the target input field and the input value constraint of the generation condition associated with the tacit knowledge category do not match.