Resource allocation for a memory built-in self-test

A system, comprising:

• a host device configured to:
• identify one or more memory resources of a memory device,
• wherein the one or more memory resources of the memory device are addressable memory resources configured for performing standard memory operations of the memory device;
• and
• transmit, to the memory device, a mode register write command to write one or more bits, to a mode register of the memory device, to indicate that the one or more memory resources of the memory device are to be used for performing a memory built-in self-test;
• and
• the memory device, wherein the memory device is configured to:
• read the one or more bits from the mode register of the memory device before performing the memory built-in self-test;
• identify the one or more memory resources of the memory device based on reading the one or more bits;
• and
• perform the memory built-in self-test for the memory device using the one or more memory resources of the memory device,
• wherein the one or more memory resources of the memory device are not used for performing the standard memory operations of the memory device based on the one or more bits indicating that the one or more memory resources of the memory device are to be used for performing the memory built-in self-test.

A method comprising:

• reading one or more bits, before performing a memory built-in self-test, that are stored in a mode register of a memory device,
• wherein the one or more bits indicate one or more rows of the memory device that are to be used for performing the memory built-in self-test;
• identifying the one or more rows of the memory device based on reading the one or more bits,
• wherein the one or more rows of the memory device are addressable rows configured for performing standard memory operations of the memory device;
• and
• performing the memory built-in self-test for one or more memory sections, but fewer than all memory sections, of a plurality of memory sections associated with the memory device,
• wherein the one or more rows of the memory device are not used for performing the standard memory operations of the memory device based on the one or more bits indicating that the one or more rows of the memory device are to be used for performing the memory built-in self-test.