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US 12,000,891 B2Granted
Scan correlation-aware scan cluster reordering method and apparatus for low-power testing
AssigneeUIF (University Industry Foundation), Yonsei University
InventorsSungho Kang, Sang Jun Lee
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Abstract
The exemplary embodiments of the present invention provides a scan cluster reordering method and apparatus which perform a scan correlation aware scan cluster reordering to reduce a power generated during the scan test and place scan cells having a high correlation to be adjacent to each other by analyzing the correlation between scan cells, and reduce a test power generated during the scan test.
Claims8
A scan cluster reordering method, comprising:
- constructing a distance matrix between scan cells using a test pattern;
- performing scan correlation clustering using the constructed distance matrix and acquiring a hierarchical structure as a clustering result;
- and
- performing scan chain reordering using the hierarchical structure,
- wherein as the scan correlation clustering, a hierarchical agglomerative clustering (HAC) is performed based on the smallest distance in the distance matrix,
- wherein in the acquiring a hierarchical structure, a dendrogram tree is output as a clustering result.
3 more elements
A scan cluster reordering apparatus including a processor,
- wherein the processor constructs a distance matrix between scan cells using a test pattern, performs scan correlation clustering using the constructed distance matrix and acquires a hierarchical structure as a clustering result, and performs scan chain reordering using the hierarchical structure,
- wherein as the scan correlation clustering, a hierarchical agglomerative clustering (HAC) is performed based on the smallest distance in the distance matrix,
- wherein the processor, a dendrogram tree is output as a clustering result.
Dependencies are inferred from the claim text.