Wireless electronic-control system

A test-plug hardware-platform, comprising:

• at least one combination input and output (I/O) connector;
• a configurable control system to provide command and operational signals through the I/O connector, the configurable control system further to collect data through the I/O connector from at least one electrical component under test, the at least one electrical component under test configured to generate and receive a plurality of signals selected from signals including digital signals and analog signals, the configurable control system being configured to test each connector on the at least one electrical component under test via software within the testplug hardware-platform;
• and
• a wireless-mesh network configured within the test-plug hardware-platform to interface wirelessly with at least the at least one electrical component under test.

A test-plug hardware-platform, comprising:

• at least one combination input and output (I/O) connector;
• a configurable control system to provide command and operational signals through the I/O connector, the configurable control system further to collect data through the I/O connector from at least one electrical component under test, the at least one electrical component under test configured to generate and receive a plurality of signals selected from signals including digital signals and analog signals;
• and
• a wireless-mesh network configured within the test-plug hardware-platform to interface wirelessly with at least the at least one electrical component under test, the test-plug hardware-platform being configured to test analog signals and digital signals substantially simultaneously.

A test-plug hardware-platform, comprising:

• at least one combination input and output-(I/O) connector;
• a configurable control system to provide command and operational signals through the I/O connector, the configurable control system further to collect data through the I/O connector from at least one electrical component under test, the at least one electrical component under test configured to generate and receive a plurality of signals selected from signals including digital signals and analog signals;
• and
• a wireless-mesh network configured within the test-plug hardware-platform to interface wirelessly with at least the at least one electrical component under test, the test-plug hardware-platform being configured to test low-level communication with the at least one electrical component test under test connected to the actual hardware in which each of the at least one electrical component under test is located.

A test-plug hardware-platform, comprising:

• at least one combination input and output (I/O) connector;
• a configurable control system to provide command and operational signals through the I/O connector, the configurable control system further to collect data through the I/O connector from at least one electrical component under test, the at least one electrical component under test configured to generate and receive a plurality of signals selected from signals including digital signals and analog signals, configuration of software within the configurable control system including an existing signal list and an interlock table for a particular tool in which the at least one electrical component under test is located;
• and
• a wireless-mesh network configured within the test-plug hardware-platform to interface wirelessly with at least the at least one electrical component under test.

A test-plug hardware-platform, comprising:

• at least one combination input and output (I/O) connector;
• a configurable control system to provide command and operational signals through the I/O connector, the configurable control system further to capture actual input and output signals to and from at least one electrical component under test, the at least one electrical component under test configured to generate and receive a plurality of signals selected from signals including digital signals and analog signals, the at least one electrical component under test being operated within a production tool;
• and
• a test computer configured to run a number of simulated devices and monitor actual I/O from each of the at least one electrical component under test.