Sampling measurement method, system, computer device and storage medium

A computer device, comprising:

• a memory storing a computer program;
• and
• a processor configured to execute the computer program stored in the memory, wherein when executing the computer program, the processor is configured to:
• acquire a preset measurement ratio of each process element in a process station;
• acquire an actual measurement ratio of a process element associated with a lot of products to be measured that arrive at a measurement station in the process station;
• in a case where the actual measurement ratio of the process element associated with the lot of products to be measured is less than a corresponding preset measurement ratio, control a measurement machine at the measurement station to measure the lot of products to be measured;
• acquire an idle ratio of the measurement machine at the measurement station;
• and
• in a case where the idle ratio of the measurement machine at the measurement station is greater than 0, determine a process element associated with the lot of products whose previous measurement time is furthest from a current moment, and increase the preset measurement ratio of the process element associated with the lot of products whose previous measurement time is furthest from the current moment by a first preset value.

A non-transitory computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed by a processor, the computer program causes the processor to:

• acquire a preset measurement ratio of each process element in a process station;
• acquire an actual measurement ratio of a process element associated with a lot of products to be measured that arrive at a measurement station in the process station;
• in a case where the actual measurement ratio associated with the lot of products to be measured is less than a corresponding preset measurement ratio, control a measurement machine at the measurement station to measure the lot of products to be measured;
• acquire an idle ratio of the measurement machine at the measurement station;
• and
• in a case where the idle ratio of the measurement machine at the measurement station is greater than 0, determine a process element associated with the lot of products whose previous measurement time is furthest from a current moment, and increase the preset measurement ratio of the process element associated with the lot of products whose previous measurement time is furthest from the current moment by a first preset value.