Apparatus for the automated assembly of a probe head

An apparatus for an automated assembly of a probe head for testing electronic devices, the apparatus comprising:

• a support configured to support at least two parallel guides, which are provided with a plurality of respective guide holes;
• at least one holding means configured to hold a contact probe to be housed in the guide holes, wherein the support is a movable support configured to be moved according to a preset trajectory between a first position, wherein the contact probe is held at a predetermined position outside the guide holes by the holding means, and a second position wherein the contact probe, which is held at the predetermined position, is housed in a set of guide holes that are substantially concentric to each other;
• actuators of the support;
• and
• a central unit connected to the actuators, the preset trajectory being calculated in the central unit according to a profile of the contact probe, the central unit being adapted to transform the profile into control instructions which are sent to the actuators of the support;
• wherein the at least one holding means comprises at least one pair of end-effectors extending from a body of the at least one holding means, as well as at least one first force sensor which is integrated in the body and is configured to measure a holding intensity of the contact probe exerted by the at least one pair of end-effectors, the apparatus further comprising a feedback system configured to adjust the holding intensity of the contact probe exerted by the at least one pair of end-effectors.