Probe pin having gripping structure
AssigneeTse Co., Ltd.
InventorsSeung Bae An, Byeong Soo Park
Life of this patent
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AssigneeTse Co., Ltd.
InventorsSeung Bae An, Byeong Soo Park
Estimating the term…
A probe pin having an improved gripping structure is disclosed. The disclosed probe pin includes a pin body including a plurality of holes and positioned at one side, a first extension portion extending upward from an outer side of the pin body, a second extension portion elongated from the other end of the first extension portion, further extending than the pin body in the other direction, and spaced apart from the pin body, and a tip part integrated with the second extension portion and having an end sharply protruding upward from an outer upper end of the second extension portion, in which the second extension portion includes a plurality of elasticity provision holes formed in parallel with an outer peripheral surface of the second extension portion and having different shapes to provide an elastic force that moves a portion of a needle of the tip part.
A probe pin comprising:
Dependencies are inferred from the claim text.