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US 12,000,800 B2Granted
System and method for passive normalization of a probe
AssigneesSaudi Arabian Oil Company, King Abdullah University of Science and Technology
InventorsFadl Abdellatif, Hesham A. Jifri, Sahejad Patel, Ali Alrasheed, Amjad Felemban, Jeff S. Shamma
Life of this patent
Estimating the term…
Abstract
A system and method passively normalize an ultrasonic dry coupled wheel probe as the probe traverses a surface of a structure to inspect the structure, such as a flat structure or a curved pipe. At least a pair of arms are configured to passively maintain normalization of the probe in a detection direction normal to the surface.
Claims13
An assembly configured to hold a probe adjacent to a test surface, comprising:
- a first connector;
- a first arm pivotably coupled to the first connector at a first end thereof, the first arm extending in a forward direction and extending in a normal direction perpendicular to the forward direction and normal to the test surface, the first arm configured to pivot with a first degree of freedom in the forward direction;
- a second arm pivotably coupled to the first connector at a first end thereof, the second arm extending in a rearward direction opposite to the forward direction and extending in the normal direction, the second arm configured to pivot with the first degree of freedom in the rearward direction;
- a pair of first mounting members each coupled to a respective second end of the first and second arms;
- a pair of first wheels each coupled to a respective first mounting member;
- and
- a holder monolithically integral with the first connector and configured to hold the probe,
- wherein the pivotable coupling of the first and second arms to the first connector passively normalizes a detection direction of the probe as the probe traverses the test surface.
5 more elements
A system configured to traverse a test surface, comprising:
- a housing:
- a drive wheel rotatably coupled to the housing and configured to traverse the test surface;
- and
- an assembly disposed within the housing and comprising:
- a first connector;
- a first arm pivotably coupled to the first connector at a first end thereof, the first arm extending in a forward direction and extending in a normal direction perpendicular to the forward direction and normal to the test surface, the first arm configured to pivot with a first degree of freedom in the forward direction;
- a second arm pivotably coupled to the first connector at a first end thereof, the second arm extending in a rearward direction opposite to the forward direction and extending in the normal direction, the second arm configured to pivot with the first degree of freedom in the rearward direction;
- a pair of first mounting members each coupled to a respective second end of the first and second arms;
- a pair of first wheels each coupled to a respective first mounting member;
- and
- a holder monolithically integral with the first connector and configured to hold a probe adjacent to the test surface,
- wherein the pivotable coupling of the first and second arms to the first connector passively normalizes a detection direction of the probe towards the test surface as the system with the probe traverses the test surface in response to rotation of the drive wheel.
9 more elements
An assembly configured to hold a probe adjacent to a test surface, comprising:
- a symmetry-preserving sub-assembly;
- a first arm coupled to the symmetry-preserving sub-assembly, the first arm extending in a forward direction and extending in a normal direction perpendicular to the forward direction and normal to the test surface, the first arm configured to pivot with a first degree of freedom in the forward direction;
- a second arm coupled to the symmetry-preserving sub-assembly, the second arm extending in a rearward direction opposite to the forward direction and extending in the normal direction, the second arm configured to pivot with the first degree of freedom in the rearward direction;
- a first wheel coupled to an end of the first arm and configured to move on the test surface;
- a second wheel coupled to an end of the second arm and configured to move on the test surface;
- and
- a holder coupled to the symmetry-preserving sub-assembly and configured to hold the probe,
- wherein the coupling of the first and second arms to the symmetry-preserving sub-assembly maintains a symmetrical configuration of the first and second arms about an axis through the probe to passively normalize a detection direction of the probe as the probe traverses the test surface.
5 more elements
Dependencies are inferred from the claim text.