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US 11,994,718 B2Granted
Mach-Zehnder interferometer with mirrored facet
AssigneeLumentum Operations LLC
InventorsBarthelemy Fondeur, Hiroaki Yamada, Jiamin Zheng
Life of this patent
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Abstract
In some implementations, a Mach-Zehnder interferometer (MZI) includes a delay line arm formed in a chip and a mirrored facet formed in the chip. The delay line arm may be configured to propagate light to the mirrored facet. The mirrored facet may be configured to reflect, to the delay line arm, a percentage of the light propagated to the mirrored facet by the delay line arm.
Claims20
A Mach-Zehnder interferometer (MZI), comprising:
- a delay line arm formed in a chip configured to propagate light to a mirrored facet formed in the chip;
- and
- the mirrored facet configured to reflect, to the delay line arm, a percentage of the light propagated to the mirrored facet by the delay line arm,
- wherein the mirrored facet comprises a trench,
- wherein a first surface of the trench is configured to reflect the percentage of the light, and
- wherein a second surface of the trench, opposite the first surface, is angled non-parallel to the first surface to reflect light that passes through the trench away from the delay line arm.
3 more elements
A Mach-Zehnder interferometer (MZI), comprising:
- a first mirrored facet formed in a chip;
- a second mirrored facet formed in the chip;
- an optical transmission element formed in the chip;
- a delay line waveguide formed in the chip that is connected between the optical transmission element and the first mirrored facet;
- and
- a non-delay line waveguide formed in the chip that is connected between the optical transmission element and the second mirrored facet,
- wherein the first mirrored facet comprises a first trench,
- wherein a first surface of the first trench is configured opposite a second surface of the first trench, and
- wherein the second surface is angled non-parallel to the first surface.
6 more elements
An optical device comprising:
- a substrate;
- a first Mach-Zehnder interferometer (MZI) formed on the substrate, comprising:
- a first delay line arm, and
- a first mirrored facet positioned at an end of the first delay line arm;
- and
- a second MZI formed on the substrate, comprising:
- a second delay line arm, and
- a second mirrored facet positioned at an end of the second delay line arm,
- wherein at least one of the first mirrored facet or the second mirrored facet comprises a trench,
- wherein a first surface of the trench is configured opposite a second surface of the trench, and
- wherein the second surface is angled non-parallel to the first surface.
8 more elements
Dependencies are inferred from the claim text.