Probe position monitoring structure and method of monitoring position of probe
AssigneeUnited Semiconductor Japan Co., Ltd.
InventorYasunobu Torii
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AssigneeUnited Semiconductor Japan Co., Ltd.
InventorYasunobu Torii
Estimating the term…
A probe position monitoring structure includes a first common line and a contact portion configured for being directly contacted with a probe. The contact portion includes a first zigzag structure, and a first end of the first zigzag structure is directly connected with the first common line. A method of monitoring a position of a probe includes the following steps. The probe position monitoring structure is provided. The first zigzag structure is directly contacted with a first probe. A resistance measurement is performed to measure a resistance of a portion of the first zigzag structure located between the first probe and the first end for monitoring a position of the first probe.
A probe position monitoring structure, comprising:
A method of monitoring a position of a probe, comprising:
Dependencies are inferred from the claim text.