DC resistance measurement contact checking via alternating current high frequency injection
AssigneeNational Instruments Corporation
InventorsChin-Hong Cheah, Tatt-Wee Oong, Eric Hartner
Life of this patent
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AssigneeNational Instruments Corporation
InventorsChin-Hong Cheah, Tatt-Wee Oong, Eric Hartner
Estimating the term…
A test system may be used for obtaining accurate remote sense voltage and/or current values. A measurement instrument may provide a regulated stimulus signal to a device under test (DUT) and measure a DUT signal developed at least partially in response to the stimulus signal. A test circuit may superimpose a test signal over the stimulus signal to cause the DUT signal to be developed further in response to the test signal. The DUT signal may be used to derive a resistance of the path that couples the measurement instrument to the DUT. The measurement instrument may include a source measure unit, the stimulus signal may be a regulated voltage, and the DUT signal may be a sense voltage. The harmonics of the DUT signal may be analyzed to determine a correlation between an amplitude of a measured fundamental frequency of the DUT signal and the resistance of the path.
A system for measuring cable resistance, the system comprising:
A system for performing accurate voltage, current, and load measurements, the system comprising:
A contact check measurement circuit comprising:
Dependencies are inferred from the claim text.