Testing device for integrated circuit package

A testing device for testing an integrated circuit package, comprising:

• a printed circuit board having a first surface and a second surface opposite to the first surface;
• a conductive layer formed on the second surface, wherein the conductive layer comprises a conductive sheet, and a conductive pad that is grounded and electrically isolated from the conductive sheet;
• a circuit element, wherein terminals of the circuit element are respectively bonded to the conductive sheet and the conductive pad;
• a testing socket disposed over the first surface;
• a conductive fastener configured to secure the testing socket to the printed circuit board, wherein the conductive fastener is electrically connected to the testing socket and the conductive sheet;
• a cover disposed above the testing socket to form a space for accommodating the integrated circuit package between the cover and the testing socket, wherein the cover has a conductive surface in contact with the integrated circuit package;
• and
• a conductive element assembly disposed between and electrically connected to the cover and the testing socket.

A testing device for testing an integrated circuit package, comprising:

• a printed circuit board comprising a first metal layer formed on a bottom surface of the printed circuit board;
• a testing socket disposed above the printed circuit board;
• a conductive fastener configured to secure the testing socket to the printed circuit board, wherein the conductive fastener is electrically connected to the first metal layer and the testing socket;
• a cover pivotally connected to the testing socket by a shaft to form a space for accommodating the integrated circuit package between the cover and the testing socket, wherein the cover is covered with an insulating layer, and has a conductive surface exposed from the insulating layer and in contact with the integrated circuit package;
• a conductive member disposed outside the cover and electrically connected to the cover;
• a conductive element disposed on the cover and electrically isolated from the conductive member;
• a circuit element disposed outside the cover, wherein terminals of the circuit element are electrically connected to the conductive member and the conductive element, respectively;
• and
• a conductive torsion spring wound around the shaft, wherein a first end of the conductive torsion spring contacts the conductive element, and a second end of the conductive torsion spring contacts the testing socket.