US 11,994,381 B2Granted

Apparatus for and method of measuring surface

AssigneeSenfit Oy

InventorsPekka Jakkula, Juha Heikkinen, Matti Limingoja, Mikko Vuolteenaho

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Abstract

An apparatus for measuring a surface comprises first sensors, which are distributed two-dimensionally in space, said first sensors interacting with the surface in a contactless manner using a microwave range of electromagnetic signals, and the first sensors receive at least two of the microwave signals of the interaction with information relating to distances between the sensors and the surface as a reflection, the microwave signals of the interaction representing both dimensions of the space of two-dimensional distribution of the first sensors. A data processing unit receives said information on the distances, and determines at least one geometrical parameter of the surface on the basis of the information.

Claims20

Dependent claims

An apparatus for measuring a moving surface, comprising:

at least three first transceivers distributed two-dimensionally in space,
at least two of the at least three first transceivers being distributed parallel with a longitudinal extent of a surface of a first edge of a sheet,
the at least two first transceivers being configured to have an interaction with the surface of the first edge in a contactless manner using a microwave range of electromagnetic signals,
the at least two first transceivers being configured to receive at least two of the microwave signals of the interaction with information relating to distances between the at least two first transceivers and the first edge at different longitudinal sections of the sheet, the microwave signals of the interaction representing both dimensions of the space of two-dimensional distribution of the at least three first transceivers;
and
a data processing unit configured to receive the information, determine at least one geometrical parameter of the first edge based on the information.

3 more elements

A method of measuring a surface, the method comprising:

transmitting, with at least three first transceivers, electromagnetic signals of a microwave range to the surface for causing an interaction with the surface in a contactless manner, the at least three first transceivers being distributed two-dimensionally in space;
receiving, by at least two of the at least three first transceivers at least two of the microwave signals of the interaction with information relating to distances between the at least three first transceivers and the surface as a reflection, the microwave signals of the interaction representing both dimensions of the space of the two-dimensional distribution of the at least three first transceivers, the microwave signals of the interaction representing both dimensions of the space of the two-dimensional distribution of the at least three first transceivers;
and
receiving, by a data processing unit, the information on the distances, and determining, by the data processing unit, at least one geometrical parameter of the surface based on the information.

1 more element

Dependencies are inferred from the claim text.

Facts

Application: 17/182,797Filed 23 Feb 2021
Priority: FI 2020518524 Feb 2020
Published: US 2021/0262792 A126 Aug 2021
Granted: 28 May 2024
Term ends: Not estimatedThe source records don’t support an estimate.

Classification18 codes

G01B 11/046
Specially adapted for measuring length or width of objects while moving: for measuring width
G01B 15/04
Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma…
G01B 11/026
For measuring length, width or thickness: by measuring distance between sensor and object
G01B 11/06
For measuring length, width or thickness: for measuring thickness ; e.g. of sheet material

Family

US 2021/0262792 A1Pre-grant publication · published 26 Aug 2021
US 11,994,381 B2This patent

From the US filing history. Foreign family members aren’t listed.

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