Device detecting abnormality of secondary battery and semiconductor device

A semiconductor device comprising:

• first to fifth transistors;
• a capacitor;
• a comparator;
• and
• first and second wirings,
• wherein one of a source and a drain of the first transistor and one of a source and a drain of the second transistor are electrically connected to the one of a source and a drain of the fifth transistor,
• wherein one of a source and a drain of the third transistor and one of a source and a drain of the fourth transistor are electrically connected to an inverting input terminal of the comparator,
• wherein the other of the source and the drain of the first transistor and the other of the source and the drain of the third transistor are electrically connected to the first wiring,
• wherein the other of the source and the drain of the second transistor, a gate of the second transistor, the other of the source and the drain of the fourth transistor, and a gate of the fourth transistor are electrically connected to the second wiring, and
• wherein the other of the source and the drain of the fifth transistor is electrically connected to one terminal of the capacitor and a non-inverting input terminal of the comparator.