Display device including test element group, and method for inspecting defect of display device
AssigneeSamsung Display Co., Ltd.
InventorsSeunghyun Park, Yun-Mo Chung
Life of this patent
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AssigneeSamsung Display Co., Ltd.
InventorsSeunghyun Park, Yun-Mo Chung
Estimating the term…
A display device includes a substrate including a display area and a test area adjacent to the display area, a lower electrode disposed in the display area on the substrate, a common layer disposed on the lower electrode, an upper electrode disposed on the common layer; and a test element group. The test element group includes a plurality of electrode patterns disposed in a same layer as the lower electrode and in the test area on the substrate, a test common layer disposed in a same layer as the common layer and on the electrode patterns, where a plurality of openings is defined through the test common layer to expose a part of each of the electrode patterns, and an electrode layer disposed in a same layer as the upper electrode, on the test common layer, and in contact with the electrode patterns through the openings.
A display device comprising:
Dependencies are inferred from the claim text.