Method for determining capacitance reference, apparatus for determining capacitance reference, and device

Abstract

A method for determining a capacitance reference, an apparatus for determining a capacitance reference, and a device are provided. The method is applied to a device with double-layer capacitive sensors, and the method comprises: obtaining a first differential capacitance value of the double-layer capacitive sensors, the first differential capacitance value being a minimum differential capacitance value obtained when the device is out of a box, and the box being a matching device paired with the device and used to receive the device; and determining a latest differential capacitance reference value according to the first differential capacitance value and a differential capacitance reference value. By tracking and updating the differential capacitance reference value, a more accurate capacitance reference is provided to ensure the accuracy of capacitance change detection, and then to ensure the accuracy of detection on the behavior state of the device.

Dependencies are inferred from the claim text.