Back to results
US 11,908,911 B2Granted
Thin film transistors with raised source and drain contacts and process for forming such
AssigneeIntel Corporation
InventorsChieh-Jen Ku, Bernhard Sell, Pei-Hua Wang
Life of this patent
Estimating the term…
Abstract
A device is disclosed. The device includes a source contact in a source contact trench and a drain contact in a drain contact trench, a channel under the source contact and the drain contact, a first spacing layer on a bottom of the source contact trench and a second spacing layer on a bottom of the drain contact trench. The first spacing layer and the second spacing layer are on the surface of the channel. The device also includes a gate electrode below the channel and a dielectric above the gate electrode and underneath the channel.
Claims13
A device, comprising:
- a source contact in a source contact trench and a drain contact in a drain contact trench;
- a channel layer under the source contact and the drain contact, the channel layer having a first depression in a source region beneath the source contact, and the channel layer having a second depression in a drain region beneath the drain contact;
- a first spacing layer on a bottom of the source contact and in the first depression in the channel layer, and a second spacing layer on a bottom of the drain contact and in the second depression in the channel layer, wherein the first spacing layer and the second spacing layer are on a surface of the channel layer, each of the first spacing layer and the second spacing layer having a central deeper portion laterally between outer shallower portions, each of the source contact and the drain contact having an upper portion wider than a bottom portion in the respective source contact trench and the drain contact trench;
- a gate electrode below the channel layer;
- a dielectric above the gate electrode and underneath the channel layer;
- and
- wherein the first spacing layer and the second spacing layer extend a distance of 15 to 30 nm up along sides of the source contact trench and the drain contact trench.
4 more elements
A device, comprising:
- a source contact and a drain contact in a source contact trench and a drain contact trench;
- a channel layer under the source contact and the drain contact, the channel layer having a first depression in a source region beneath the source contact, and the channel layer having a second depression in a drain region beneath the drain contact;
- a first spacing layer on a bottom of the source contact and in the first depression in the channel layer, and a second spacing layer on a bottom of the drain contact and in the second depression in the channel layer, wherein the first spacing layer and the second spacing layer are on a surface of the channel layer and line sidewalls of the source contact trench and the drain contact trench each of the first spacing layer and the second spacing layer having a central deeper portion laterally between outer shallower portions, each of the source contact and the drain contact having an upper portion wider than a bottom portion in the respective source contact trench and the drain contact trench;
- a gate electrode below the channel layer;
- and
- a dielectric above the gate electrode and underneath the channel layer;
- and
- wherein the first spacing layer and the second spacing layer extend a distance of 15 to 30 nm up along sides of the source contact trench and the drain contact trench.
5 more elements
Dependencies are inferred from the claim text.