Contaminant control in thermocompression bonding of semiconductors and associated systems and methods
AssigneeMicron Technology, Inc.
InventorsBrandon P. Wirz, Jaekyu Song, Sui Chi Huang
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AssigneeMicron Technology, Inc.
InventorsBrandon P. Wirz, Jaekyu Song, Sui Chi Huang
Estimating the term…
Systems and methods for controlling contamination during thermocompression bonding are provided herein. The tool generally includes a bondhead having a first channel extending in a lateral direction from a first port along a second side toward a perimeter of the bondhead. In several examples, the bondhead includes a second channel fluidly coupled to a second port and extending in a lateral direction along an inset surface of the bondhead, where the second channel at least partially surrounds the first channel. In other examples, the tool includes a vacuum manifold having a vacuum opening positioned laterally outward from the bondhead. A first flow unit is coupled to the first channel and is configured to withdraw air. A second flow unit is coupled to the second port or the manifold to withdraw fluid and prevent outgassing bonding materials from entering the first channel, depositing on the bondhead, and/or contaminating neighboring semiconductor components.
A method for inhibiting vaporized bonding material from entering a vacuum system, the method comprising:
Dependencies are inferred from the claim text.