Method and system for controlling profile of critical dimension
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsJun Shimada, Chen-Fon Chang, Chih-Teng Liao
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Abstract
An etching apparatus is provided to be able to rotate or tilt a substrate holder on which a to-be-processed substrate is placed. According to a profile of a pre-process critical dimension of the substrate, the etching apparatus may rotate or tilt the substrate holder during an etching process in order to achieve a desired profile of a post-process critical dimension of the substrate that is related to the pre-process critical dimension.
Claims20
A method for controlling a profile of a critical dimension of a substrate, comprising:
- forming a plurality of first features having a pre-process critical dimension on the substrate;
- analyzing a profile of the pre-process critical dimension for the substrate;
- and
- performing an etching process on the substrate to form a plurality of second features on the substrate, wherein the second features correspond to the first features and have a post-process critical dimension that is related to the pre-process critical dimension;
- wherein the substrate is rotated during the etching process when analysis of the profile of the pre-process critical dimension reveals a first condition that the pre-process critical dimension measured at a peripheral portion of the substrate is smaller than that measured at a central portion of the substrate on average;
- wherein a rotational speed at which the substrate is rotated is positively correlated to a difference between an average value of the pre-process critical dimension measured at the peripheral portion of the substrate and an average value of the pre-process critical dimension measured at the central portion of the substrate.
A method for controlling a profile of a critical dimension of a substrate, comprising:
- forming a plurality of first features having a pre-process critical dimension on the substrate;
- analyzing a profile of the pre-process critical dimension for the substrate;
- and
- performing an etching process on the substrate to form a plurality of second features on the substrate, wherein the second features correspond to the first features and have a post-process critical dimension that is related to the pre-process critical dimension;
- wherein the substrate is tilted during the etching process when analysis of the profile of the pre-process critical dimension reveals a first condition that the pre-process critical dimension measured at a specific portion of the substrate that corresponds to a specific angular range of the substrate is greater than that measured at the remaining portions of the substrate on average.
A method for controlling a profile of a critical dimension of a substrate, comprising:
- forming a plurality of first features having a pre-process critical dimension on the substrate;
- analyzing a profile of the pre-process critical dimension for the substrate;
- analyzing a piece of apparatus data that indicates non-uniformity of the etching apparatus where the etching process is performed;
- and
- performing an etching process on the substrate to form a plurality of second features on the substrate, wherein the second features correspond to the first features and have a post-process critical dimension that is related to the pre-process critical dimension;
- wherein the substrate is rotated at a varying rotational speed during the etching process when the piece of apparatus data indicates that the etching apparatus is not uniform in terms of etching rates and when analysis of the profile of the pre-process critical dimension reveals a first condition that the pre-process critical dimension measured at a specific portion of the substrate that corresponds to a specific angular range of the substrate is greater than that measured at the remaining portions of the substrate on average.
Dependencies are inferred from the claim text.