Multi-sampled, charge-sharing thermometer in memory device
AssigneeMicron Technology, Inc.
InventorsAgostino Macerola, Gianni Rea
Life of this patent
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AssigneeMicron Technology, Inc.
InventorsAgostino Macerola, Gianni Rea
Estimating the term…
A memory device includes an array of memory cells, a diode having a threshold voltage that changes with temperature, an analog-to-digital converter (ADC), and a pulse generator. The ADC includes a voltage comparator having a positive terminal coupled with the diode. The ADC further includes a first capacitor coupled between a negative terminal of the voltage comparator and ground, and a second capacitor selectively coupled between the first capacitor and a voltage reference node. The second capacitor has a smaller capacitance than that of the first capacitor. The pulse generator is coupled with the ADC and generates pulses. The pulses cause the first capacitor to connect to the second capacitor and equalize charge between the first capacitor and the second capacitor. An inverted signal of the pulses causes the second capacitor to be coupled with the voltage reference node to pre-charge the first capacitor.
A memory device comprising:
A system comprising:
A method of operating a memory device comprising a memory array, a diode having a threshold voltage that changes with temperature, and an analog-to-digital converter (ADC) coupled with the memory array, the ADC comprising a voltage comparator having a positive terminal coupled with the diode, a first capacitor coupled between a negative terminal of the voltage comparator and ground, and a second capacitor coupled between the first capacitor and a voltage reference node, the second capacitor also coupled with the ground and having a smaller capacitance than that of the first capacitor, and wherein the method of operating the memory device comprises:
Dependencies are inferred from the claim text.