Gate test part and display device including the same
AssigneeSamsung Display Co., Ltd.
InventorsKwan-Yup Shin, Jun-Ho Bae, Mi-Sun Lee
Life of this patent
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Abstract
A gate test part includes a plurality of composite pads electrically connected to a plurality of gate lines. The gate lines extend in a first direction and are disposed along a second direction crossing the first direction. Each of the composite pads includes an antistatic pad, a first test pad spaced apart from the antistatic pad and providing a gate test signal to each of the gate lines, and a second test pad overlapping the antistatic pad and the first test pad. The second test pad electrically connects the antistatic pad and the first test pad.
Claims17
A gate test part comprising a plurality of composite pads electrically connected to a plurality of gate lines, wherein the gate lines extend in a first direction and are disposed along a second direction crossing the first direction;
- and
- a black matrix disposed on the composite pads,
- wherein each of the composite pads comprises:
- an antistatic pad;
- a first test pad separated and spaced apart from the antistatic pad and providing a gate test signal to each of the gate lines;
- and
- a second test pad overlapping the antistatic pad and the first test pad, the second test pad electrically connecting the antistatic pad and the first test pad,
- wherein an area of the antistatic pad is smaller than an area of the first test pad,
- wherein the second test pad contacts the antistatic pad through a plurality of first contact holes and contacts the first test pad through a second contact hole, and
- wherein an area of each of the first contact holes is smaller than an area of the second contact hole.
A display device comprising:
- a display panel including a plurality of gate lines;
- a gate driver adjacent to the display panel and providing a gate signal to the gate lines;
- and
- a gate test part including a plurality of composite pads and a black matrix disposed on the composite pads, wherein the composite pads are electrically connected to the gate lines,
- wherein each of the composite pads comprises:
- an antistatic pad;
- a first test pad separated and spaced apart from the antistatic pad and providing a gate test signal to each of the gate lines;
- and
- a second test pad overlapping the antistatic pad and the first test pad, the second test pad electrically connecting the antistatic pad and the first test pad through a plurality of contact holes,
- wherein an area of the antistatic pad is smaller than an area of the first test pad,
- wherein the second test pad contacts the antistatic pad through a plurality of first contact holes and contacts the first test pad through a second contact hole, and
- wherein an area of each of the first contact holes is smaller than an area of the second contact hole.
Dependencies are inferred from the claim text.