Stack-based ray traversal with dynamic multiple-node iterations
AssigneesAdvanced Micro Devices, Inc., ATI Technologies ULC
InventorsDaniel James Skinner, Michael John Livesley, David William John Pankratz
Life of this patent
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Abstract
A technique for performing ray tracing operations is provided. The technique includes, in response to detecting that a threshold number of traversal stage work-items of a wavefront have terminated, increasing intersection test parallelization for non-terminated work-items.
Claims20
A method for performing ray tracing operations, the method comprising:
- detecting that a threshold number of traversal stage work-items of a wavefront have terminated;
- and
- in response to the detecting, increasing intersection test parallelization for non-terminated work-items.
A system for performing ray tracing operations, the system comprising:
- a memory configured to store instructions;
- and
- a processor configured to execute a wavefront, the executing including:
- detecting that a threshold number of traversal stage work-items of the wavefront have terminated, and
- in response to the detecting, increasing intersection test parallelization for non-terminated work-items.
A non-transitory computer-readable medium storing instructions that when executed by a processor cause the processor to perform operations including:
- detecting that a threshold number of traversal stage work-items of a wavefront have terminated;
- and
- in response to the detecting, increasing intersection test parallelization for non-terminated work-items.
Dependencies are inferred from the claim text.