Data storage device and error tolerance selecting method thereof
AssigneeSilicon Motion, Inc.
InventorSheng-Yuan Huang
Life of this patent
Estimating the term…
Abstract
A data storage device, and an error tolerance selecting method thereof which includes: writing data to data blocks of the data storage device; reading written data of the data blocks as read data; comparing the read data and the written data of each data column in the data blocks, and calculating a number of error bits in each chunk including a plurality of data columns accordingly; calculating a difference value between the number of error bits in the chunk and a first threshold value to store the difference value in an error tolerance list; and selecting a largest difference value in the error tolerance list as an error tolerance.
Claims12
An error tolerance selecting method, applied to a data storage device, wherein the data storage device comprises a control unit and a data storage medium, and the data storage medium comprises a plurality of data blocks, each data block comprises a plurality of data columns, and the plurality of data columns are divided into a plurality of chunks, the control unit is configured to execute the error tolerance selecting method at least once, and the selecting method comprising:
- writing data to the plurality of data blocks;
- reading written data of the plurality of data blocks as read data;
- comparing the read data and the write data of each data column in the plurality of data blocks, and calculating a number of error bits in each chunk accordingly;
- selecting a column with a largest number of error bits in a chunk with a largest number of error bits as a bad data column;
- calculating a difference value between the number of error bits in the chunk and a first threshold value to store the difference value in an error tolerance list until a number of bad data columns is equal to a second threshold value;
- and
- selecting a largest difference value in the error tolerance list as the error tolerance and acquiring a number of the bad data columns corresponding to the largest difference value;
- wherein, the first threshold value is a number of correctable error bits of error correction code in the data storage device;
- wherein, the second threshold value is a total number of recordable bad data columns in the data storage device.
A data storage device, comprising:
- a data storage medium, comprising a plurality of data blocks, wherein each of the plurality of data blocks comprises a plurality of data columns, and the plurality of data columns are divided into a plurality of chunks;
- and
- a control unit, connected to the data storage medium, and configured to execute an error tolerance selecting method, the selecting method includes:
- writing data to the plurality of data blocks;
- reading written data of the plurality of data block as read data;
- comparing the read data and the write data of each data column in the plurality of data blocks, and calculating a number of error bits in each chunk accordingly;
- selecting a column with a largest number of error bits in a chunk with a largest number of error bits as a bad data column;
- calculating a difference value between the number of error bits in the chunk and a first threshold value to store the difference value in an error tolerance list until a number of bad data columns is equal to a second threshold value;
- and
- selecting a largest difference value in the error tolerance list as the error tolerance and acquiring a number of bad data columns corresponding to the largest difference value;
- wherein, the first threshold value is a number of correctable error bits of error correction code in the data storage device;
- wherein, the second threshold value is a total number of recordable bad data columns in the data storage device.
Dependencies are inferred from the claim text.