Methods and systems for performing built-in-self-test operations without a dedicated clock source
AssigneeSamsung Electronics Co., Ltd.
InventorsA Santosh Kumar Reddy, Gunjan Mandal, Parin Rajnikant Bhuta, Raghavendra Molthati, Saikat Hazra, Sanjeeb Kumar Ghosh, Sunil Rajan, Krupal Jitendra Mehta, Praveen S Bharadwaj
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