Contact assembly array and testing system having contact assembly array
AssigneeJohnstech International Corporation
InventorsValts Treibergs, Max A. Carideo, David Skodje, Melissa Hasskamp
Life of this patent
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Abstract
A contact assembly for a testing system for testing integrated circuit devices is disclosed. The contact assembly includes a first blade, a second blade, and an elastomer configured to retain the first blade and the second blade. The first blade and the second blade are electrically conductive. The first blade and the second blade are arranged in a cross configuration so that the first blade and the second blade form a substantially X-shape when assembled. The elastomer is at least columnar in part and non-conductive.
Claims20
A contact assembly for a testing system for testing integrated circuit devices, comprising:
- a first blade;
- a second blade;
- and
- an elastomer configured to retain the first blade and the second blade,
- wherein the first blade and the second blade are electrically conductive,
- the first blade and the second blade are arranged in a cross configuration so that the first blade and the second blade form a substantially X-shape in a top view when assembled,
- the elastomer is at least columnar in part and non-conductive, and
- the elastomer is configured to provide a rotational bias force to twist arms of the first blade and the second blade on the X-shape formed by the first blade and the second blade.
A testing system for testing integrated circuit devices, comprising:
- a device under test;
- a load board;
- and
- a contact assembly including:
- a first blade;
- a second blade;
- and
- an elastomer configured to retain the first blade and the second blade,
- wherein the first blade and the second blade are electrically conductive,
- the first blade and the second blade are arranged in a cross configuration so that the first blade and the second blade form a substantially X-shape in a top view when assembled, and
- the elastomer is at least columnar in part and non-conductive,
- wherein a first end of the first blade is configured to contact a terminal of the device under test,
- a first end of the second blade is configured to contact a terminal of the load board,
- the elastomer is configured to provide a rotational bias force to twist arms of the first blade and the second blade on the X-shape formed by the first blade and the second blade.
A method of assembling and positioning a contact assembly in a testing system for testing integrated circuit devices, the method comprising:
- arranging a first blade and a second blade of the contact assembly in a cross configuration so that the first blade and the second blade form a substantially X-shape in a top view, the first blade and the second blade being electrically conductive;
- retaining the first blade and the second blade with an elastomer of the contact assembly, the elastomer being at least columnar in part and non-conductive;
- and
- installing the contact assembly in a housing,
- wherein the elastomer is configured to provide a rotational bias force to twist arms of the first blade and the second blade on the X-shape formed by the first blade and the second blade.
Dependencies are inferred from the claim text.