Electric potential measuring device and method for manufacturing electric potential measuring device
AssigneeSony Semiconductor Solutions Corporation
InventorNaohiko Kimizuka
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AssigneeSony Semiconductor Solutions Corporation
InventorNaohiko Kimizuka
Estimating the term…
To provide an electric potential measuring device that can further improve evaluation quality. Provided is an electric potential measuring device including a plurality of readout electrodes arranged in an array form and each configured to detect an electric potential of an action potential generation point generated by an action of a cell, an insulating member, a reference electrode configured to detect a reference potential, and an amplification section configured to obtain a potential difference between a detected electric potential based on the readout electrode and a detected electric potential based on the reference electrode, in which the readout electrode has a covered region where the insulating member is stacked on the readout electrode and an opened region where the insulating member is not stacked on the readout electrode, and the readout electrode has, in the opened region, at least one high portion with high height and/or at least one low portion with low height, with a stacking surface of the readout electrode with the insulating member as a standard.
An electric potential measuring device comprising:
An electric potential measuring device comprising:
A method for manufacturing an electric potential measuring device, the method comprising:
A method for manufacturing an electric potential measuring device, the method comprising:
Dependencies are inferred from the claim text.