Enhanced impedance measurement using CTMU
AssigneeMicrochip Technology Incorporated
InventorsBogdan Bolocan, Ezana Haile, Pat Richards
Life of this patent
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AssigneeMicrochip Technology Incorporated
InventorsBogdan Bolocan, Ezana Haile, Pat Richards
Estimating the term…
A method and apparatus for measuring an unknown impedance. The apparatus comprises a first input to receive a first signal generated by a first portion of a sensor circuit, the first portion comprising an unknown impedance and a first known resistance, the unknown impedance to vary based upon a phenomenon to be measured by the sensor circuit. The apparatus also comprises a second input to receive a second signal generated by a second portion of the sensor circuit, the second portion of the sensor circuit comprising a known impedance and a second known resistance. And the apparatus comprises control logic to, based on a difference in time at which each of the first input and the second input reach a reference voltage, determine a measurement of the sensor circuit.
An apparatus, comprising:
A method for measuring an unknown and variable impedance comprising:
A sensing apparatus to measure a phenomenon, comprising:
Dependencies are inferred from the claim text.