Systems, apparatuses, or components for electrolytic corrosion protection of electronic element testing apparatuses

A cable assembly comprising:

• a first wire segment;
• a second wire segment;
• and
• a parallel circuit connected between the first wire segment and the second wire segment, the parallel circuit having
• a first path with a predetermined resistor connected between a first node and a second node, and
• a second path with two oppositely oriented Zener diodes connected in series between the first node and the second node, the first path and the second path being electrically parallel paths,
• wherein the first wire segment is connected to the first node and the second wire segment is connected to the second node.

A system comprising:

• a test circuit configured to receive a device-under-test (DUT) and to run test programs on the DUT, the test circuit having a test circuit electric reference potential serving as a circuit ground for the test circuit;
• a metallic thermal contact surface configured to contact the DUT connected to the test circuit and operable to regulate a temperature of the DUT when in contact with the DUT during testing;
• a chassis electric reference potential for electrostatic discharge grounding of a tester chassis;
• and
• an electrical insulation arrangement connected between the metallic thermal contact surface and the chassis electric reference potential to insulate the metallic thermal contact surface from the chassis electric reference potential,
• wherein an electric potential difference exists between the chassis electric reference potential and the test circuit electric reference potential.