Mass spectrometer

A mass spectrometer, comprising:

• an ionization section configured to generate ions from a sample;
• a mass separation section configured to separate ions generated by the ionization section according to mass-to-charge ratio;
• an ion detector configured to detect an ion separated by the mass separation section;
• an ion capture section configured to capture an ion separated by the mass separation section;
• an auxiliary measurement section configured to measure a physical quantity of the ion captured by the ion capture section, where the physical quantity is different from mass-to-charge ratio;
• wherein the auxiliary measurement section includes:
• an irradiation section configured to irradiate ions captured within the ion capture section with electromagnetic waves or a particle beam;
• and
• a detection section configured to detect electromagnetic waves or a particle exiting from the ion capture section;
• wherein the irradiation section is an electron-beam irradiation section configured to deliver an electron beam into the ion capture section;
• and
• the detection section is configured to detect the electron beam diffracted by the ion;
• a molecular structure candidate input reception section configured to receive an input of information of a molecular structure candidate;
• and
• a first molecular structure estimation section configured to estimate a molecular structure of a molecule contained in a sample by comparing an electron diffraction image obtained by a measurement of the sample and an electron diffraction image prepared for the molecular structure candidate.

A mass spectrometer, comprising:

• an ionization section configured to generate ions from a sample;
• a mass separation section configured to separate ions generated by the ionization section according to mass-to-charge ratio;
• an ion detector configured to detect an ion separated by the mass separation section;
• an ion capture section configured to capture an ion separated by the mass separation section;
• an auxiliary measurement section configured to measure a physical quantity of the ion captured by the ion capture section, where the physical quantity is different from mass-to-charge ratio;
• a voltage application section configured to apply a rectangular voltage for capturing ions within the ion capture section,
• wherein the auxiliary measurement section includes:
• an irradiation section configured to irradiate ions captured within the ion capture section with electromagnetic waves or a particle beam;
• and
• a detection section configured to detect electromagnetic waves or a particle exiting from the ion capture section;
• wherein the irradiation section is an electron-beam irradiation section configured to deliver an electron beam into the ion capture section;
• and
• the detection section is configured to detect the electron beam diffracted by the ion;
• wherein the electron beam irradiation section is configured to be capable of varying energy of the electron beam.

A mass spectrometer, comprising:

• an ionization section configured to generate ions from a sample;
• a mass separation section configured to separate ions generated by the ionization section according to mass-to-charge ratio;
• an ion detector configured to detect an ion separated by the mass separation section;
• an ion capture section configured to capture an ion separated by the mass separation section;
• an auxiliary measurement section configured to measure a physical quantity of the ion captured by the ion capture section, where the physical quantity is different from mass-to-charge ratio;
• a voltage application section configured to apply a rectangular voltage for capturing ions within the ion capture section,
• wherein the auxiliary measurement section includes:
• an irradiation section configured to irradiate ions captured within the ion capture section with electromagnetic waves or a particle beam;
• and
• a detection section configured to detect electromagnetic waves or a particle exiting from the ion capture section;
• wherein the irradiation section is an electron-beam irradiation section configured to deliver an electron beam into the ion capture section;
• and
• the detection section is configured to detect the electron beam diffracted by the ion;
• a third molecular structure estimation section configured to estimate a molecular structure of a sample molecule based on an electron diffraction image obtained by a measurement of a compound formed by bonding a previously determined kind of atom to a specific position of the sample molecule.