Inspection apparatus, control method, and program

An inspection apparatus comprising:

• a memory configured to store instructions;
• and
• a processor configured to execute the instructions including:
• detect an inspection object from first image data in which the inspection object is included;
• generate second image data by performing a geometric transform on the first image data in such a way that a view of the detected inspection object satisfies a predetermined reference;
• and
• learn, by using the second image data, an identification model for detecting an abnormality of the inspection object, wherein
• in the geometric transform, a degree of divergence between a second parameter representing a second view of the inspection object on the second image data and the reference becomes smaller than a degree of divergence between a first parameter representing a first view of the inspection object on the first image data and the reference.

A control method comprising:

• detecting, by a processor, an inspection object from first image data in which the inspection object is included;
• generating, by the processor, second image data by performing a geometric transform on the first image data in such a way that a view of the detected inspection object satisfies a predetermined reference;
• and
• detecting, by the processor using an identification model, an abnormality of the inspection object included in the second image data, wherein
• the identification model is learned by using image data in which learning inspection objects having views satisfying the predetermined reference are included, and
• in the geometric transform, a degree of divergence between a second parameter representing a second view of the inspection object on the second image data and the reference becomes smaller than a degree of divergence between a first parameter representing a first view of the inspection object on the first image data and the reference.