Two-photon stimulated emission depletion composite microscope using continuous light loss

A two-photon stimulated emission depletion composite microscope using continuous light loss, comprising a two-photon imaging unit and a stimulated emission depletion (STED) imaging unit,

• the two-photon imaging unit comprises a femtosecond laser emitter, a first reflector, a second reflector, a beam expander composed of a first lens and a second lens, a third reflector, a first dichroic mirror, a λ/4 wafer, a fourth reflector, an XY scanning mirror, a scanning lens, a tube lens, a second dichroic mirror, an objective lens, a three-dimensional nano-positioning platform for placing a sample thereon, an optical filter, a fifth reflector, a third lens, and a photomultiplier tube;
• wherein
• femtosecond laser emitted by the femtosecond laser emitter is reflected by the first reflector and the second reflector and enters the beam expander composed of the first lens and the second lens to form a light beam, and the light beam exits from the second lens and is reflected by the third reflector to enter the first dichroic mirror and is transmitted through the first dichroic mirror to enter the λ/4 wafer, and then the light beam is reflected by the fourth reflector to enter the XY scanning mirror, and the light beam exiting from the XY scanning mirror sequentially passes through the scanning lens and the tube lens to enter the second dichroic mirror, and the light beam transmitted through the second dichroic mirror enters the objective lens and is focused by the objective lens onto a sample placed on the three-dimensional nano-positioning platform;
• and fluorescence emitted by the sample is collected by the objective lens and then enters the second dichroic mirror, and after being reflected by the second dichroic mirror, the fluorescence enters the optical filter, and the optical filter is configured to suppress an incident laser and transmit the fluorescence, and the fluorescence transmitted through the optical filter is reflected by the fifth reflector and then enters the third lens, and the fluorescence is focused by the third lens to enter the photomultiplier tube which is configured to detect a two-photon imaging fluorescence signal;
• and
• the STED imaging unit comprises the femtosecond laser emitter, the first reflector, the second reflector, the beam expander composed of the first lens and the second lens, the third reflector, a continuous laser emitter, a sixth reflector, a seventh reflector, an eighth reflector, a phase plate, the first dichroic mirror, the λ/4 wafer, the fourth reflector, the XY scanning mirror, the scanning lens, the tube lens, the second dichroic mirror, the objective lens, the three-dimensional nano-positioning platform for placing a sample thereon, the optical filter, the fifth reflector, a fourth lens, a pinhole, and an avalanche photodiode, the fifth reflector being removable from an original optical path where it is initially located, wherein
• femtosecond laser emitted by the femtosecond laser emitter is reflected by the first reflector and the second reflector and enters the beam expander composed of the first lens and the second lens, and a light beam exiting from the second lens is reflected by the third reflector to enter the first dichroic mirror, and then the light beam is transmitted through the first dichroic mirror to form an excitation light;
• and
• laser emitted by the continuous laser emitter enters the eighth reflector after being reflected by the sixth reflector and the seventh reflector, and then enters the phase plate after being reflected by the eighth reflector, and a light beam transmitted through the phase plate is reflected by the first dichroic mirror to form a depletion light, and the excitation light and the depletion light are combined by the first dichroic mirror, and the combined beam enters the λ/4 wafer for polarization state adjustment, and is then reflected by the fourth reflector to enter the XY scanning mirror, and the light beam exiting from the XY scanning mirror sequentially passes through the scanning lens and the tube lens TL to enter the second dichroic mirror, and the light beam transmitted through the second dichroic mirror enters the objective lens and then is focused by the objective lens onto a sample placed on the three-dimensional nano-positioning platform, and fluorescence emitted by the sample is collected by the objective lens and then enters the second dichroic mirror, and after being reflected by the second dichroic mirror, the fluorescence enters the optical filter, the optical filter is configured to suppress an incident laser and transmit the fluorescence, and with the fifth reflector removed from the original optical path where the fifth reflector is initially located, the fluorescence transmitted through the optical filter directly enters the fourth lens and is focused to the pinhole located at a focus of the fourth lens, and the light beam exiting from the pinhole enters the avalanche photodiode which is configured to detect an STED imaging fluorescence signal.